Lattice misfit versus performance of thin film electroluminescent structures
نویسندگان
چکیده
منابع مشابه
Electrical Characterization of Thin-film Electroluminescent Devices
Electrical characterization methods for the analysis of alternating current thinfilm electroluminescent (ACTFEL) devices are reviewed. Particular emphasis is devoted to electrical characterization techniques because ACTFEL devices are electro-optic display devices whose performance is to a large extent determined by their electrical properties. A systematic procedure for ACTFEL electrical asses...
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ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 2001
ISSN: 0021-8979
DOI: 10.1063/1.1335646